Experimental techniques and equipment

 

Atomic force and scanning tunneling microscopy (AFM, STM)

- combined UHV-atomic force and scanning tunnel microscope (VT-AFM 25 RH, Omicron)

- temperature regime 25 - 750 K

- atomic resolution in AFM mode by means of the beam deflection technique

 

Fourier transform infrared spectroscopy (FTIRS) in transmission, reflexion and diffuse reflexion

- interferometer BRUKER IFS 120 HR (resolution <0.01 cm-1)

- interferometer BRUKER IFS 66 v with rapid scan und step scan technique (resolution 0.1 cm-1)

- several ultrahigh vacuum machines for FTIRS experiments

- DRIFTS unit for experiments in the pressure range <1 to >10 bar and at temperatures <900°C

 

Gas chromatography, coupled to mass spectroscopy (GC-MS)

- GC-MS for the investigation of gas mixtures in catalysed reactions (AGILENT Technologies)

 

Helium atom scattering (HAS)

- HAS apparatus HELIOS for elastic and inelastic helium atom scattering (MPI für Strömungsforschung, Göttingen)

 

Low energy electron diffracation (LEED)

- 4-grid LEED optics with shutter and AES electronics (SPECS)

- MCP-LEED with two channelplates for surfaces extremely sensitive to electron bombardment (Omicron)

- SPA-LEED for analysis of diffraction spot profiles (LEYBOLD)

 

X-ray and ultraviolet photoelectron spectroscopy (XPS, UPS)

- electron energy analyser with 9 channeltrons in a multi-purpose ultrahigh vacuum machine (PHOIBOS 150, SPECS)

- x-ray source with Mg/Al twin anode (XR 50, SPECS)

- monochromatic x-ray source with Al/Ag twin anode (FOCUS 500, SPECS)

- uv source for He I and He II radiation

 

Ultrahigh vacuum systems

- various ultrahigh vacuum systems for the investigation of insulators, semiconductors and metals

- cryostats for sample temperatures as low as 4 K

- cleavage devices for the in situ preparation of insulator single crystals

- diverse experimental techniques (see above)